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 ¹ÝµµÃ¼ ¿ë¾îÁý 2 (I~M) ´ëÇÏ¿© |
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I-Line Steeper »çÁø °øÁ¤½Ã »ç¿ëµÇ´Â °¡½Ã±¤¼±ÀÇ ±¤¿øÁß, Àڿܼ± ¿µ¿ªÀÇ 365§¬ÀÇ ÆÄÀåÀ» °®´Â »çÁø Àåºñ.
Iagc(AGC Current) AGC Àü·ù.
Ib(Base Current) º£À̽º Àü·ù.
IC(Collector Current) ÄÝ·ºÅÍ Àü·ù.
IC Memory Á¾·¡ÀÇ ÀÚ¼ºÃ¼ ´ë½Å¿¡ ¹ÙÀÌÆú¶ó TRÀ̳ª MOS TR·Î F-F¸¦ ±¸¼ºÇÏ¿© ±âº» Memory(Cell)¸¦ ¸¸µç IC ȸ·Î.
IC Ä«µå(Integrated Circuit Card) ÁýÀûȸ·Î(IC)¸¦ ³»ÀåÇÑ Ä«µåÀÇ ¸íĪ. Á¾·¡ÀÇ Ä«µå¿¡ ºñÇØ ±â¾ï¿ë·®°ú ¾ÈÀü¼ºÀÌ ÇÑÃþ Çâ»óµÇ¾î ±ÝÀ¶, À¯Åë, ÀÇ·á µî ÀÀ¿ëºÐ¾ß°¡ ³Ð°í ´Ù±â´ÉÀûÀÎ ¿ªÇÒÀ» °¡Áø ´ÙÀ½ ¼¼´ëÀÇ Ä«µå·Î ±â´ëµÈ´Ù.
Icc(Circuit Current) Á¦Ç°°ø±Þ Àü·ù.
ICCE(International Conference on Consumer Electronics)
ICE(In Circuit Emulator) Program °³¹ß½Ã Àü Debugging °úÁ¤À» ÅëÁ¦ÇÏ´Â H/W System.
ICOT(Institute for new Generation Computer Technolgy) ÀϺ»¿¡¼ 82³â Â÷¼¼´ë ÄÄÇ»Å͸¦ °³¹ßÇϱâ À§ÇØ ¼³¸³ÇÑ ¿¬±¸¼Ò.
IC Tester(ÁýÀûȸ·Î °Ë»çÀåÄ¡ Integrated Circuit Tester) ÃâÇÏÁ÷Àü ICÀÇ Àü¾ÐÀ̳ª ÀúÇ× µîÀÇ Àü±âÀû Ư¼ºÀ» °Ë»çÇÏ°í ºÒ·®Ç°À» Á¦°ÅÇÏ´Â ÀåÄ¡. ºÒ·®Ç°°ú ¾çǰ(åÐù¡)À» ÀÚµ¿ÀûÀ¸·Î ±¸º°ÇÏ´Â ATE(Automatic Test Equipment=ÀüÀÚµ¿°Ë»çÀåÄ¡)°¡ ÁÖ·ù¸¦ ÀÌ·ç°í ÀÖÀ½.
ID-TV(Improved Definition TV) ÇöÇà TV ¹æ½Ä¿¡¼ ¼ö»ó±â¸¸À» °³Á¶ÇÏ¿© °íÈÁúÀ» Ãß±¸ÇÑ ¹æ½Ä. °¡°Ý °æÀï·ÂÀÌ ¾ø¾î ÇâÈÄ Á¦Ç°À¸·Î¼ÀÇ ¹æÇâÀº ºÒÅõ¸íÇÑ »óÅÂÀÓ.
IDP(Integrated Data Processing) EDPS(ÀüÀÚÁ¤º¸Ã³¸®½Ã½ºÅÛ) ¹æ½ÄÀ» ´õ¿í ¹ßÀü½ÃÄÑ Áö¿ªÀûÀ¸·Î ºÐ»êÇØ¼ ¹ß»ýÇÏ´Â µ¥ÀÌÅ͸¦ ÁýÁßó¸®ÇÏ´Â ¹æ½Ä.
I¡¤D Card(Indentification Card) (¼ÒÁöÀÎÀÌ ´©±¸Àΰ¡¸¦ °¡¸®Å°´Â) ½ÅºÐ Áõ¸í¼.
Ids MOS TR¿¡¼ µ¿À۽à Source¿Í Dran°£¿¡ È帣´Â Àü·ù.
Ie(Emitter Current) ¿¡¹ÌÅÍ Àü·ù.
IEC(International Electrotechnical Commission) ±¹Á¦Àü±â Ç¥ÁØÈ¸ÀÇ.
IEC(Integrated Equipment Computer) ¾ÕÀ¸·ÎÀÇ ÁýÀûȸ·Î°¡ ÁöÇâÇÏ´Â ÃßÀ̷μ, ¸ðµç ÀåºñÀÇ ±â´ÉÀÌ ÇϳªÀÇ ¹ÝµµÃ¼ ÁýÀûȸ·Î·Î ±¸¼ºµÇ´Â °Í.
IEEE(Insitute of Electrical and Electronics Engineers) ¹Ì±¹ÀÇ Àü±â ÀüÀÚ °øÇÐȸ·Î¼ Àü¼¼°è¿¡ ȸ¿øÀÌ ºÐÆ÷µÇ¾î ÀÖ°í, °¢Á¾ Çмú°ü°è °£Ç๰À» ¹ß°£Çϰí ÀÖÀ½.
IGBT(Insulated Gate Bipolar Transistors).
IGFET(Insulated-Gate-Field-Effect-Transistor) (MOSFETÀÇ ´Ù¸¥ ¸íĪ).
I2L(Integrated Injection Logic) ÀúÇ× ´ë½Å Bipolar Transistor ÇüÅÂÀÇ ±¸Á¶ÀÎ PNPÇü Transistor ºÎÇÏ¿Í ¿ª µ¿ÀÛÀ» ÇÏ´Â NPNÇü Transistor¸¦ ÀÌ¿ëÇÑ ³í¸®È¸·Î·Î Àü·Â¼Ò¸ð°¡ Àû°í ¼Óµµ°¡ ºü¸§.
I3L(Isoplanar Integrated Injection Logic) I2LÀÇ °³·®µÈ ±â¼ú·Î ÀÌ·ç¾îÁø ³í¸®È¸·Î·Î, °¢ ¼ÒÀÚ»çÀ̸¦ »êȸ·À¸·Î °Ý¸®½ÃÄÑ ÁýÀûµµ¸¦ »ó½Â½ÃŲ °Í.
ILT(Infant Life Test) Ãʱâ¼ö¸í½ÃÇè(½Å·Ú¼º) 48½Ã°£ Burn In°ú °°À½.
Image Sticking(ÀÜ»ó) µ¿ÀÏ È¸éÀ» Àå½Ã°£ ÄÑ µÎ¾úÀ» ¶§ ȸéÀÌ ¹Ù²î¾îµµ »óÀÌ ³²¾ÆÀÖ¾î ¿À·£µ¿¾È ¾ø¾îÁöÁö ¾Ê°í ³²¾ÆÀÖ´Â °ÍÀ» ¸»Çϸç, ghost È¿°ú¶ó ÇÑ´Ù.
IMO(Inter Metal Oxide) Multi Level Metal Process¸¦ Àû¿ëÇϰí ÀÖ´Â °øÁ¤¿¡¼, °¢ Metal Layer°£ÀÇ Àý¿¬À» À§ÇÏ¿© »ç¿ëµÇ´Â Oxide¸¦ ¸»ÇÔ. ÁÖ·Î Low Temperatare¿¡ ÀÇÇÑ PECVD Oxide(TEOS ¹× SiH4°è)°¡ »ç¿ë.
Impact Ionization °íü°ÝÀÚ ³»¿¡¼ Electric field¿¡ ÀÇÇØ¼ °¡¼ÓµÈ electron°ú atomÀÌ Ãæµ¹ÇÏ¿© electron-hole Pair¸¦ »ý¼º½ÃŰ´Â Çö»óÀ» ¸»ÇÔ.
Implanter(À̿ ÁÖÀÔ±â) ºÒ¼ø¹°À» °Á¦·Î Wafer¿¡ ÁÖÀÔ½ÃŰ´Â ÀåÄ¡·Î½á °íÀü·ù, ÁßÀü·ù, ÀúÀü·ù À̿ ÁÖÀԱ⠵î 3 Á¾·ù°¡ ÀÖ´Ù.
Implanting(ÀÌ¿ÂÁÖÀÔ) Wafer ³»ºÎ·Î B(ºØ¼Ò)³ª P(ÀÎ) µîÀ» Implanter¸¦ ÀÌ¿ëÇØ ÁÖÀÔ½ÃŰ´Â °ÍÀ» ¸»ÇÔ.
Impurity ¹ÝµµÃ¼ÀÇ Àü±âÈ帧¿¡ ±â¿©ÇÏ´Â °¢Á¾ ¿ø¼Ò¸¦ ¸»Çϸç, PÇü°ú NÇü ºÒ¼ø¹°·Î ³ª´®. PÇü : B, Al, Ga, In µî NÇü : P, As, Sb µî
Incomplete Block Design ºÒ¿Ïºñ Block °èȹ¹ý. ½ÇÇè°ø°£ÀÌ ½ÇÇèÀÇ ¹Ýº¹ ¼öÇà¿¡ ÇÊ¿äÇÑ ½ÇÇè´ÜÀ§°¡ ¸ðµÎ Æ÷ÇԵǾî ÀÖÁö ¾ÊÀº Block »óÅ·ΠºÐ¸®µÇ¾î ÀÖ´Â ½ÇÇè°èȹ¹ýÀ» ¸»ÇÑ´Ù.
In-Control Process Æò°¡µÇ°í ÀÖ´Â ÃøÁ¤Ä¡°¡ Åë°èÀû °ü¸®»óÅ¿¡ ÀÖ´Â °øÁ¤.
Index Feeding ÀÛ¾÷´ë À§¿¡¼ ÀÛ¾÷À» Çϰųª, ÀÛ¾÷ÀÌ Á¾·áµÈ Lead FrameÀ̳ª À̼۵Ǵ ÀÚÀ縦 À̵¿½ÃŰ´Â °Í.
Index Register ¸Þ¸ð¸®³»ÀÇ Address¸¦ ÁöÁ¤Çϱâ À§ÇÑ Register.
Induced Cholesteric Phase ³×¸¶Æ½»ó¿¡ ¾×Á¤»óÀ» °®´Â ±¤ÇРȰ¼ºÀÎ Ä«À̶ö ºÐÀÚ¸¦ °¡Çϸé ÄÝ·¹½ºÅ׸¯»óÀÌ ³ªÅ¸³´Ù. À̸¦ À¯µµ ÄÝ·¹½ºÅ׸¯»óÀ̶ó ÇÑ´Ù.
Induced Smectic Phase È¥ÇÕ ¾×Á¤¿¡ ÀÖ¾î¼ Á¦°¢±â ¼ººÐ ´Üµ¶À¸·Î ½º¸Þƽ»óÀ» ¸¸µéÁö ¾Ê´Â °æ¿ì¿¡µµ È¥ÇÕ°è¿¡¼´Â ¾î¶² ¼ººÐºñÀÇ |
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